s32_f64           456 test/cctest/test-assembler-arm.cc       case s32_f64:
s32_f64           508 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  0, 0);
s32_f64           509 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  0.5, 0);
s32_f64           510 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -0.5, 0);
s32_f64           511 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  1.5, 2);
s32_f64           512 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -1.5, -2);
s32_f64           513 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  123.7, 124);
s32_f64           514 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -123.7, -124);
s32_f64           515 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  123456.2,  123456);
s32_f64           516 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -123456.2, -123456);
s32_f64           517 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, static_cast<double>(kMaxInt), kMaxInt);
s32_f64           518 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMaxInt + 0.49), kMaxInt);
s32_f64           519 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMaxInt + 1.0), kMaxInt, true);
s32_f64           520 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMaxInt + 0.5), kMaxInt, true);
s32_f64           521 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, static_cast<double>(kMinInt), kMinInt);
s32_f64           522 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMinInt - 0.5), kMinInt);
s32_f64           523 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMinInt - 1.0), kMinInt, true);
s32_f64           524 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMinInt - 0.51), kMinInt, true);
s32_f64           526 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM,  0, 0);
s32_f64           527 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM,  0.5, 0);
s32_f64           528 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, -0.5, -1);
s32_f64           529 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM,  123.7, 123);
s32_f64           530 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, -123.7, -124);
s32_f64           531 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM,  123456.2,  123456);
s32_f64           532 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, -123456.2, -123457);
s32_f64           533 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, static_cast<double>(kMaxInt), kMaxInt);
s32_f64           534 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, (kMaxInt + 0.5), kMaxInt);
s32_f64           535 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, (kMaxInt + 1.0), kMaxInt, true);
s32_f64           536 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, static_cast<double>(kMinInt), kMinInt);
s32_f64           537 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, (kMinInt - 0.5), kMinInt, true);
s32_f64           538 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RM, (kMinInt + 0.5), kMinInt);
s32_f64           540 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ,  0, 0);
s32_f64           541 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ,  0.5, 0);
s32_f64           542 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, -0.5, 0);
s32_f64           543 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ,  123.7,  123);
s32_f64           544 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, -123.7, -123);
s32_f64           545 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ,  123456.2,  123456);
s32_f64           546 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, -123456.2, -123456);
s32_f64           547 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, static_cast<double>(kMaxInt), kMaxInt);
s32_f64           548 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, (kMaxInt + 0.5), kMaxInt);
s32_f64           549 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, (kMaxInt + 1.0), kMaxInt, true);
s32_f64           550 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, static_cast<double>(kMinInt), kMinInt);
s32_f64           551 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, (kMinInt - 0.5), kMinInt);
s32_f64           552 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RZ, (kMinInt - 1.0), kMinInt, true);