RN               2967 src/arm/simulator-arm.cc   ASSERT((mode == RN) || (mode == RM) || (mode == RZ));
RN               2980 src/arm/simulator-arm.cc     case RN:
RN               3046 src/arm/simulator-arm.cc     ASSERT((mode == RM) || (mode == RZ) || (mode == RN));
RN               3069 src/arm/simulator-arm.cc         case RN: {
RN                508 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  0, 0);
RN                509 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  0.5, 0);
RN                510 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -0.5, 0);
RN                511 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  1.5, 2);
RN                512 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -1.5, -2);
RN                513 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  123.7, 124);
RN                514 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -123.7, -124);
RN                515 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN,  123456.2,  123456);
RN                516 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, -123456.2, -123456);
RN                517 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, static_cast<double>(kMaxInt), kMaxInt);
RN                518 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMaxInt + 0.49), kMaxInt);
RN                519 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMaxInt + 1.0), kMaxInt, true);
RN                520 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMaxInt + 0.5), kMaxInt, true);
RN                521 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, static_cast<double>(kMinInt), kMinInt);
RN                522 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMinInt - 0.5), kMinInt);
RN                523 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMinInt - 1.0), kMinInt, true);
RN                524 test/cctest/test-assembler-arm.cc   TestRoundingMode(s32_f64, RN, (kMinInt - 0.51), kMinInt, true);
RN                558 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, -0.5, 0);
RN                559 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, -123456.7, 0, true);
RN                560 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, static_cast<double>(kMinInt), 0, true);
RN                561 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, kMinInt - 1.0, 0, true);
RN                598 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN,  0, 0);
RN                599 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN,  0.5, 0);
RN                600 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN,  1.5, 2);
RN                601 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN,  123.7, 124);
RN                602 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN,  123456.2,  123456);
RN                603 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, static_cast<double>(kMaxInt), kMaxInt);
RN                604 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, (kMaxInt + 0.49), kMaxInt);
RN                605 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, (kMaxInt + 0.5),
RN                607 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, (kMaxUInt + 0.49), kMaxUInt);
RN                608 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, (kMaxUInt + 0.5), kMaxUInt, true);
RN                609 test/cctest/test-assembler-arm.cc   TestRoundingMode(u32_f64, RN, (kMaxUInt + 1.0), kMaxUInt, true);